Bowman XRF Series coating Thickness Gauge

» Bowman XRF Series coating Thickness Gauge

Bowman XRF offers a comprehensive range of coating Thickness Gauges.

advanced-system-engineering

These spectrometers are designed and built in the USA by a team with many years experience of the coating thickness industry and are ideally suited for:

  • Printed Circuit Boards for ENIG and ENEPIG compliance
  • Semiconductors and lead frames
  • General Metal Finishing, especially platers doing alloy plating such as ZnNi
  • Jewelry plating and purity.
  • Tool Steel
  • Plumbing fixtures (Cr/Ni/ on plastic)
  • Semiconductor Wafer manufacturer

intuitive-user-interface

The modular design of the hardware makes all key parts “hot swapable” and allows rapide fix time and minimise down time.

The product range includes the following series:

  • B SERIES: entry level in the top down optics. There is no motorised stage. Measurement is adjusted from above
  • P SERIES: top down measurement with motorised X-Y stage. Motorised measurement head. Mutli measurement, line scans and other test modes available
  • O Series: top down measurement with Poly Capillary Optics and micro spot down to 80um.X-Y stage included. Designed for the most demanding application.
  • M Series: top down measurement with Poly Capillary Optics and micro spot down to 15um. X-Y stage included. Designed for the most demanding application.
  • L Series. offers the same performance as the P series with a much larger sample chamber

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Browse each tab for more details on the model best suits your requirements or contact us direct to discuss your requirements and work out the best solution form this extensive range.
An application by application guide to help select the right model can be found on the Bowman Website. Please click below to be transferred:

PRODUCT SELECTOR

Alternatively, please let us know your requirements and we will provide expert advice.

 

 

Or call us now on 0161 442 9963 to speak to a Product Specialist.

You can also visit the Bowman XRF website for more product details by clicking on their logo below:

bowman-logo

BOWMAN B SERIES

B-Series-XRF

 

The B Series is the entry level coating thickness gauge using a top-down measurement configuration that Bowman offers.

The sample stage is a fixed , and operators would manually position parts for testing. This manual positioning can be monitored using the live video image to align the desired location within the crosshairs on the screen.

It is ideally suited for simpler coating applciations and for users with limited budgets within the following industries:

  • Zinc plating
  • Copper plating
  • Zinc Alloys plating
  • Nickel Chrome plating
  • Decorative Finishes

Or call us now on 0161 442 9963 to speak to a Product Specialist.

You can also visit the Bowman XRF website for more product details by clicking on their logo below: bowman-logo

O-Series-XRF

The P series XRF is a flexible analyser capable of measuring a wide variety of sample sizes, shapes, and quantities. It includes high precision programmable X-Y stage . Operators can use the mouse and software interface to move to desired measurement locations easily. Multi-point programs can be created to automatically measure multiple sample locations with the click of a button. Pinpoint control is achievable for testing critical areas on parts. Multi-point programming is available for high throughput requirements. The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. Collimators and focal distances can be customized for particular application requirements. The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.

The main applications for the P-series Bowman XRF are:

  • ENIG and ENEPIG
  • Electroless gold plating
  • Electrolytic Nickel Gold
  • Printed circuit boards ( Gold on Nickel on Cupper plating)
  • Connector industries
  • HASL / HASL lead-free
  • Silver coatings
  • Solder Alloys
  • Tin plating

 

Need more information:

 

 

 

Or call us now on 0161 442 9963 to speak to a Product Specialist.

You can also visit the Bowman XRF website for more product details by clicking on their logo below: bowman-logo

 

O Series capillary optics

O-Series-XRF

 

The O Series is the first model in the high performance range from Bowman combining high performance with a small x-ray spot size. The O-series introduce  poly-capillary  optics system rather then usinga collimator assembl. The optics focus the x-rays coming from the tube exit window to a very small spot size (80μm FWHM) while retaining virtually 100% of the tube flux. This in contrast with a collimator which attenuates the x-rays that can’t fit through the small apertures.  The poly-capillary optics assembly allows almost all of the x-rays energy from the tube to reach the sample. The result is much greater sensitivity for testing very small components or thin coatings. Shorter test times can achieve even better repeatability when comparing optics systems vs. a similar sized collimator.

Furthermore, the camera on the O Series has a greater magnification compared to other models like the P Series, with a 45x video magnification and 5x higher digital zoom. A programmable X-Y sample stage is also standard.

Typical applications for the O series are:

  • Gold plating
  • Silver plating
  • Electroless Nickel
  • “White Bronze” (Cu-Sn-Zn)
  • Palladium/Palladium Alloys
  • Tin/Tin Alloys
 

 

 

Or call us now on 0161 442 9963 to speak to a Product Specialist.

You can also visit the Bowman XRF website for more product details by clicking on their logo below: bowman-logo

M-Series advanced Polycapillary system

M-Series-XRF

 

The M Series is the ultimate in high performance plating testing allowing for  the smallest x-ray spot sizes to be used for the smallest of testing points. The poly-capillary optics in the M Series is superior to the one fitted on the O Series, focusing the x-ray beam down to 15μm FWHM. To measure features on that scale, a 150x magnification camera is included in order t get the best magnifaction of the sample being tested. A second, macro second camera takes a macro-image of the part to be measured, which completements the first hig magnification one. The combination of both cameras allows the operator simutlaneously to see the entire part, click the image to zoom in with the high-mag camera, and pinpoint the specific aread to be measured.

The high-precision programmable X-Y stage can be used to select and measure multiple points; the pattern recognition software can also do this automatically. There is a 2-D mapping system that can be used to see the topography of a coating over the surface area of a part such as a silicon wafer.

The standard configuration includes the 15μm Optics, and a high resolution SDD detector to process the higher count rates. A micro/macro camera system has one camera with 150x magnification and even higher digital zoom. A programmable X-Y sample stage is also standard. The Optics system has a close focal distance, so samples measured with the the M Series must be flat.

 

 

Or call us now on 0161 442 9963 to speak to a Product Specialist.

You can also visit the Bowman XRF website for more product details by clicking on their logo below: bowman-logo 

L Series XRF

L-Series-XRF

The L Series is the most flexible instrument that Bowman offers in terms of sample size. It offers the same testing performance as the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches in any direction, the L Series is the perfect solution. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured.

The chamber is fully enclosed and boasts a capacity to hold samples up to 22”x24”x13” (LxWxH). The X-Y stage travel distance is 10”x10”.

The standard L-Series configuration has the 4-position collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10” z-height with stage, 13” without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.

 

 

Or call us now on 0161 442 9963 to speak to a Product Specialist.

You can also visit the Bowman XRF website for more product details by clicking on their logo below: bowman-logo