Nanohunter II

Total reflection X-ray Fluorescence (TXRF) spectrometer for rapid trace elemental analysis and thin film characterization

» Nanohunter II

NanoHunter II:

NEW Benchtop total reflection X-ray Fluorescence (TXRF) spectrometer

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The new NanoHunter II.

The Rigaku NANOHUNTER II benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed to offer comprehensive trace element and materials characterization analysis capabilities to a broader range of research disciplines, and in more diverse analytical settings, than was possible with previous technology. Whether for geologists, chemists, biochemists, biologists, materials scientists and engineers, non-destructive trace element analysis is attainable, with minimal to no sample preparation, for applications that span from metallo-protein research to environmental assessment and semiconductor wafer metrology.

With its new high performance crystals, the sensitivity of toxic metals such as As and Cd are vastly improved.

Further performance is achieved with its 600W tube excitation up to high voltages

Rigaku NanoHunter

Need more information:

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Further information from the RIGAKU website can be found here (click on logo).
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Sensitivity on par with ICP-OES without wet chemistry

With sensitivity on par with inductively coupled plasma optical emission spectroscopy (ICP-OES), NANOHUNTER provides part-per-billion (PPB) level detection limits in a fully automated tool. Direct measurement of residues on a smooth surface provides freedom from complex sample digestion or preparation and makes this spectrometer suitable for replacing or supplementing traditional atomic spectroscopy methods. Compared to other trace level atomic spectroscopy techniques, the revolutionary aspect of NANOHUNTER is in the minimal level of sample preparation required. It liberates the operator from ancillary equipment – like fume hoods and microwave digesters – associated with trace element analysis in a wet laboratory environment.

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Features

  • Analysis of elements from Al to U
  • Variable incidence angle for depth profiling of thin films
  • Dual X-ray tubes for superior sensitivity and elemental coverage
  • Perform grazing incidence X-ray fluorescence (GIXRF) analysis
  • Perform total reflection X-ray fluorescence (TXRF) analysis
  • Compact benchtop design with low power consumption
  • Suitable for mobile laboratories
  • 16-position autosampler
  • Face up analysis for maximum flexibility
  • Accepts large samples (up to 10 x 10 cm and 5 mm thick)
  • Tube above optics minimizes contamination issues
  • Trace element analysis
  • No sample digestion
  • No consumables
  • Non-destructive
  • Parts-per-billion (PPB) detection limits