Seiko SFT110 XRF Coating Thickness analyser

» Seiko SFT110 XRF Coating Thickness analyser

Description

The Long awaiting cost effective Coating Thickness has arrived in the shape of the SFT110.

SFT-110

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1. Easy setting
Optical image of the sample automatically appeared on the display once the sample placed on the stage.

2. 50nm Au plating thickness can be measured precisely in 10 seconds
Optimum geometry realize higher sensitivity even under micro beam, which enables better measurement accuracy with round 0.1 or 0.2 mm collimator.

3. Measurement without the standard sample.
Measurement can be done without thickness standard sample(s) by expanding the FP software. Measurement of multilayer film and alloy film can be done easily.

4. Easy positioning by Wide View System
New Wide View System (option) which enable to observe the whole sample image (size max. 250x200mm), makes easy setting of the measurement position.

More Info

For further information,prices or if you want to talk to someone at SciMed about this product please please call 0161 491 3068 or click here.

Further information in the Hitachi High Tech website can be found here (click on logo).

hitachi_logo_e

Key Features

  • 50 kV 1 mA tungsten tube, air cooled
  • Large measuring chamber (option: slotted)
  • Selection of sample stages (manual or motorized)
  • Autofocus and auto positioning system
  • Second camera for wide view observation
  • Multi collimator changer
  • A choice of detectors (prop counter to SDD)

More Info

For further information,prices or if you want to talk to someone at SciMed about this product please please call 0161 491 3068 or click here.

Further information in the Hitachi High Tech website can be found here (click on logo).

hitachi_logo_e