XSort Hand Held XRF

» XSort Hand Held XRF

The  xSORT family of handheld ED-XRF spectrometers delivers elemental testing and chemical analysis of a wide range of materials in various conditions. These energy dispersive X-ray fluorescence devices are known for their ruggedness and reliability on the job.

They provide metals or nonmetals identification in seconds, with innovative technologies and designs that provide repeatable, and reliable results. Simple, user-friendly displays and efficient ergonomics make these instruments extremely easy to use.

Available in different con figurations and at a range of affordable prices, the  xSORT spectrometers are leaders in their class for a broad spectrum of applications.

Field-proven Quality

xSORT spectrometers are used on site, or in the most challenging field location. They deliver laboratory-quality results in a matter of seconds.  The design includes long-term reliability solutions. For example: its shutter and unique iCAL standardization system allow  xSORT to continuously correct for drift — eliminating the need for tedious annual recalibration!

 

Safest Design:

The xSort offers the highest level of protection against backscattered x-ray radiation, hence protecting the user from any radiation.

 

 

 

 

 

 

 

xSORT NonAlloy applications– Fast Element Screening

Our largest silicon drift detector (SDD) helps provide reliable measurement and analysis of nonmetallic materials — with an outstanding level of performance. Get high-productivity spot checks in a few seconds, or hold on the sample longer for laboratory-quality ppm results. Ideal for environmental and RoHS compliance screening, as well as for geological exploration and more.

When  xSORT NonAlloy is used as an XRF RoHS tester, operators don’t need to mess with methods or bother with flushes or vacuum systems. As a RoHS tester, it can compare results with stored limit values as ABOVE LIMIT, BELOW LIMIT or INCONCLUSIVE.

For more complex matrices such as in environmental screening,  xSORT achieves very low detection limits without the need for complex sample preparation.

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